Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs.
Chao PengYunfei EnZhengxuan ZhangYuan LiuZhifeng LeiPublished in: Microelectron. Reliab. (2017)
Keyphrases
- cmos technology
- silicon on insulator
- low voltage
- low power
- parallel processing
- x ray
- power consumption
- infrared
- integrated circuit
- pid controller
- low cost
- control strategy
- steady state error
- image sensor
- image processing
- fuzzy controller
- closed loop
- signal processing
- single link
- transmission electron microscopy
- evolutionary algorithm