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Total-dose-induced edge effect in SOI NMOS transistors with different layouts.

Jie LiuJicheng ZhouHongwei LuoXuedong KongYunfei EnQian ShiYujuan He
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • edge detection
  • data sets
  • power consumption
  • edge information
  • low power
  • neural network
  • image sequences
  • multiscale
  • integrated circuit
  • high density
  • multiple scales
  • edge points