EDGE POINTS
Experts
- Josef Kittler
- Bernard De Baets
- Muhittin Gökmen
- Rachid Deriche
- Olivier Monga
- Wenlong Fu
- John Illingworth
- Mauro Carlo Beltrametti
- Mohammed Atiquzzaman
- Mark Johnston
- Anna Maria Massone
- Mengjie Zhang
- Reinhard Klette
- Humberto Bustince Sola
- Martin Baca
- Azriel Rosenfeld
- Zhuowen Tu
- Baptiste Magnier
- Michael Kaufmann
- Masahiro Tomono
- Songde Ma
- Haruko Okamura
- Zhanyi Hu
- Carlos Lopez-Molina
- Jihun Park
- Tamal K. Dey
- Manuel González Hidalgo
- Ching-Chung Li
- Sun-Yuan Hsieh
- Spiros Fotopoulos
- Atsushi Imiya
- Kevin W. Bowyer
- Alex Pappachen James
- Till Bruckdorfer
- Ladislav Stacho
- Rae-Hong Park
- Lantao Yu
- Dimitrios Ioannou
- Thomas Risse
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Discret. Math.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- Image Vis. Comput.
- CVPR
- ICASSP
- Ars Comb.
- IEEE Access
- IEEE Trans. Image Process.
- ICPR (1)
- Comput. Vis. Graph. Image Process.
- ICPR
- ISCAS
- MVA
- IGARSS
- J. Graph Theory
- ICIP (3)
- Discret. Appl. Math.
- Electron. J. Comb.
- IET Image Process.
- IEEE Geosci. Remote. Sens. Lett.
- SMC
- Comput. Aided Geom. Des.
- ICCV
- IEEE Internet Things J.
- Theor. Comput. Sci.
- Graphs Comb.
- J. Comb. Theory, Ser. B
- ICIP (1)
- Multim. Tools Appl.
- IROS
- Systems and Computers in Japan
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Signal Process. Lett.
- CCCG
- Comput. Vis. Image Underst.
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