MULTIPLE SCALES
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Farzin Mokhtarian
- Atsushi Imiya
- Jixiang Meng
- Licheng Jiao
- Shangguang Wang
- Jean-Michel Morel
- Max A. Viergever
- Li Zhang
- Arjan Kuijper
- Tomoya Sakai
- Schahram Dustdar
- Jing Wang
- Jinhai Li
- Songde Ma
- Carla-Fabiana Chiasserini
- Alan L. Yuille
- J. Andrew Bangham
- Erik D. Demaine
- Michael Kaufmann
- Haruko Okamura
- Michael Felsberg
- Petros A. Petrosyan
- Mads Nielsen
- Ivona Brandic
- Nitinder Mohan
- Lei Zhang
- Yan Zhang
- Jan-Olof Eklundh
- Richard W. Harvey
- Marco Loog
- Tibor Jordán
- Riste Skrekovski
- Martin Baca
- Ewa Pawluszewicz
- Jon Sporring
- Xiao Ma
Venues
- CoRR
- IEEE Access
- Discret. Math.
- Discret. Appl. Math.
- ICIP
- Remote. Sens.
- CVPR
- ICASSP
- Scale-Space
- IEEE Trans. Pattern Anal. Mach. Intell.
- Graphs Comb.
- ICPR
- Appl. Math. Comput.
- J. Graph Theory
- Ars Comb.
- IEEE Trans. Image Process.
- Pattern Recognit.
- Symmetry
- Sensors
- IGARSS
- Pattern Recognit. Lett.
- Neurocomputing
- ICCV
- J. Math. Imaging Vis.
- Multim. Tools Appl.
- Entropy
- J. Comput. Phys.
- Comput. Math. Appl.
- Appl. Math. Lett.
- BMVC
- Electron. J. Comb.
- ISBI
- SSVM
- EMBC
- J. Comb. Theory, Ser. B
- Image Vis. Comput.
- Electron. Notes Discret. Math.
- Int. J. Comput. Vis.
- Comput. Graph. Forum
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