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Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs.
Chao Peng
Rui Gao
Zhifeng Lei
Zhangang Zhang
Yiqiang Chen
Yunfei En
Yun Huang
Published in:
IEEE Access (2021)
Keyphrases
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