A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.

Rui Gao Mehzabeen Mehedi Haibao Chen Xinsheng Wang Jianfu Zhang Xiaoling Lin Zhiyuan He Yiqiang Chen Dengyun Lei Yun Huang Yunfei En Zhigang Ji Runsheng Wang

Published in: IRPS (2020)

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