Xuepeng Zhan

Publication Activity (10 Years)

Years Active: 2020-2024
Publications (10 Years): 18

Top Topics

Top Venues

Sci. China Inf. Sci.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Yang Feng, Zhaohui Sun, Chengcheng Wang, Xinyi Guo, Junyao Mei, Yueran Qi, Jing Liu, Junyu Zhang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen
Operation Scheme Optimizations to Achieve Ultra-high Endurance (1010) in Flash Memory with Robust Reliabilities. CoRR (2024)
Shaoqi Yang, Xiaohuan Zhao, Kenie Xie, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen
One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash. ASICON (2023)
Junyao Mei, Bo Chen, Pengpeng Sang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen
Opto-Electronic Monolayer ZnO Memristor Produced via Low Temperature Atomic Layer Deposition. ICTA (2023)
Yang Feng, Yueran Qi, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen
Flash-based Computing-in-memory Architectures with High-accuracy and Robust Reliabilities for General-purpose Applications. ASICON (2023)
Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen
High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (10) (2023)
Zhichao Du, Chuanxue Sun, Xiaoyu Dou, Pengpeng Sang, Xuepeng Zhan, Chengji Jin, Jixuan Wu, Jiezhi Chen
Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD. ICTA (2023)
Yang Feng, Bing Chen, Mingfeng Tang, Yuerang Qi, Maoying Bai, Chengcheng Wang, Hai Wang, Xuepeng Zhan, Junyu Zhang, Jing Liu, Jixuan Wu, Jiezhi Chen
Near-threshold-voltage operation in flash-based high-precision computing-in-memory to implement Poisson image editing. Sci. China Inf. Sci. 66 (12) (2023)
Shuhao Wu, Bo Chen, Chengcheng Wang, Junyao Mei, Maoying Bai, Xuepeng Zhan, Jixuan Wu, Junshuai Chai, Hao Xu, Xiaolei Wang, Jiezhi Chen
Dual-pulse disturb-free programming scheme for FeFET based neuromorphic computing. Microelectron. J. 137 (2023)
Xiaohuan Zhao, Shaoqi Yang, Kenie Xie, Yang Feng, Qianwen Wang, Pengpeng Sang, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen
Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme. ICTA (2023)
Mingtao Xu, Bo Chen, Qi Jin, Lu Tai, Xuepeng Zhan, Jiezhi Chen
Voltage and temperature dependence of Random Telegraph Noise and their impacts on random number generator. Microelectron. J. 125 (2022)
Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen
Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage. CASES (2022)
Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang, Fei Wu, Jiezhi Chen
Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (11) (2022)
Kenie Xie, Pena Guo, Fei Chen, Binglu Chen, Xiaotong Fang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen
Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash. ICTA (2022)
Xuepeng Zhan, Jiezhi Chen, Zhigang Ji
Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors. Sci. China Inf. Sci. 65 (8) (2022)
Yifang Xi, Xiaotong Fang, Yachen Kong, Yifan Guo, Hongzhe Lin, Xuepeng Zhan, Jiezhi Chen
Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT Security. ICTA (2021)
Yang Feng, Fei Wang, Xuepeng Zhan, Yuan Li, Jiezhi Chen
Flash memory based computing-in-memory system to solve partial differential equations. Sci. China Inf. Sci. 64 (6) (2021)
Xuepeng Zhan, Yifang Xi, Qianwen Wang, Weiqiang Zhang, Zhigang Ji, Jiezhi Chen
Dual-Point Technique for Multi-Trap RTN Signal Extraction. IEEE Access 8 (2020)
Yachen Kong, Meng Zhang, Xuepeng Zhan, Rui Cao, Jiezhi Chen
Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (11) (2020)