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Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash.

Kenie XiePena GuoFei ChenBinglu ChenXiaotong FangJixuan WuXuepeng ZhanJiezhi Chen
Published in: ICTA (2022)
Keyphrases
  • charge coupled devices
  • website
  • error rate
  • data sets
  • machine learning
  • random access