Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT Security.
Yifang XiXiaotong FangYachen KongYifan GuoHongzhe LinXuepeng ZhanJiezhi ChenPublished in: ICTA (2021)
Keyphrases
- flash memory
- buffer management
- solid state
- garbage collection
- random access
- file system
- main memory
- embedded systems
- database systems
- b tree
- security level
- data storage
- disk drives
- small size
- security problems
- storage devices
- management system
- information security
- ct images
- x ray
- storage systems
- medical images
- data structure
- personal computer
- data integrity
- security mechanisms
- hand held devices