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Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions.

Yachen KongMeng ZhangXuepeng ZhanRui CaoJiezhi Chen
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • flash memory
  • database systems
  • solid state
  • disk drives
  • data sets
  • neural network
  • multi agent systems