Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory.
Menghua JiaYachen KongXuepeng ZhanMeng ZhangFei WuJiezhi ChenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
- flash memory
- highly reliable
- read write
- storage media
- disk drives
- solid state
- hard disk
- file system
- buffer management
- garbage collection
- main memory
- embedded systems
- random access
- b tree
- database systems
- data storage
- storage devices
- application programs
- memory management
- storage medium
- small size
- database
- software systems
- data model
- mobile devices
- training set