Optimizing YOLOv7 for Semiconductor Defect Detection.

Enrique Dehaerne Bappaditya Dey Sandip Halder Stefan De Gendt

Published in: CoRR (2023)

Keyphrases

defect detection
feature extraction
automated visual inspection
textured surfaces
neural network
decision trees
semiconductor manufacturing
information retrieval
artificial intelligence
learning environment
expert systems