Sandip Halder

Publication Activity (10 Years)

Years Active: 2011-2024
Publications (10 Years): 19

Top Topics

Defect Detection

Defect Classification

Semiconductor Manufacturing

Top Venues

Publications

Bappaditya Dey, Vic De Ridder, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge
Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. CoRR (2024)
Amit Prasad, Bappaditya Dey, Victor Blanco, Sandip Halder
An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection. CoRR (2024)
Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray
Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS. CoRR (2024)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
Optimizing YOLOv7 for Semiconductor Defect Detection. CoRR (2023)
Sara Sacchi, Bappaditya Dey, Iacopo Mochi, Sandip Halder, Philippe Leray
Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt
YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. CoRR (2023)
Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge
Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. CoRR (2023)
Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR (2023)
MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. CoRR (2023)
Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR (2023)
Vic De Ridder, Bappaditya Dey, Sandip Halder, Bartel Van Waeyenberge
SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation. CoRR (2023)
Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray, Sandip Halder
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. CoRR (2023)
Bappaditya Dey, Dipam Goswami, Sandip Halder, Kasem Khalil, Philippe Leray, Magdy A. Bayoumi
Deep Learning-Based Defect Classification and Detection in SEM Images. CoRR (2022)
Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. CoRR (2022)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert
Code Generation Using Machine Learning: A Systematic Review. IEEE Access 10 (2022)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder
A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. ICECS 2022 (2022)
Imen Chakroun, Thomas J. Ashby, Sayantan Das, Sandip Halder, Roel Wuyts, Wilfried Verachtert
Using Unsupervised Machine Learning for Plasma Etching Endpoint Detection. ICPRAM (2020)
Sandip Halder, Ingrid De Wolf, Alain Phommahaxay, Andy Miller, Mireille Maenhoudt, Gerald Beyer, Bart Swinnen, Eric Beyne
In-line metrology and inspection for process control during 3D stacking of IC's. 3DIC (2011)