A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection.

Enrique Dehaerne Bappaditya Dey Sandip Halder

Published in: ICECS 2022 (2022)

Keyphrases

deep learning
defect detection
object detectors
weakly supervised
object detection
object class
object recognition
object categories
bounding box
unsupervised learning
feature extraction
object classes
machine learning
superpixels
computer vision
viewpoint