Enrique Dehaerne

Publication Activity (10 Years)

Years Active: 2020-2023
Publications (10 Years): 12

Top Topics

Defect Detection

Feature Extractors

Top Venues

Publications

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
Optimizing YOLOv7 for Semiconductor Defect Detection. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt
YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. CoRR (2023)
Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR (2023)
MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. CoRR (2023)
Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Wannes Meert
A Machine Learning Approach Towards SKILL Code Autocompletion. CoRR (2023)
Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. CoRR (2022)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert
Code Generation Using Machine Learning: A Systematic Review. IEEE Access 10 (2022)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder
A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. ICECS 2022 (2022)
Edoardo Milana, Bert Van Raemdonck, Kevin Cornelis, Enrique Dehaerne, Jef De Clerck, Yarno De Groof, Toon De Vil, Benjamin Gorissen, Dominiek Reynaerts
EELWORM: a bioinspired multimodal amphibious soft robot. RoboSoft (2020)