Deep Learning-Based Defect Classification and Detection in SEM Images.
Bappaditya DeyDipam GoswamiSandip HalderKasem KhalilPhilippe LerayMagdy A. BayoumiPublished in: CoRR (2022)
Keyphrases
- deep learning
- image features
- image classification
- input image
- image database
- test images
- image retrieval
- pattern recognition
- object recognition
- multiple images
- defect classification
- weakly supervised
- partial occlusion
- lighting conditions
- segmentation algorithm
- object detection
- target object
- bounding box
- color histogram
- viewpoint
- training set
- deep belief networks
- computer vision