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Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling.
M. Houssa
Marc Aoulaiche
Stefan De Gendt
Guido Groeseneken
Marc M. Heyns
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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positive and negative
low voltage
transmission line
information systems
modeling method