Dimitris P. Ioannou

Publication Activity (10 Years)

Years Active: 2014-2023
Publications (10 Years): 6

Top Topics

Positive Effects

Cmos Technology

Top Venues

Microelectron. Reliab.

Publications

Dimitris P. Ioannou, Ephrem G. Gebreselasie, Vinh Pham, Uppili S. Raghunathan
Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs. BCICTS (2023)
Uppili S. Raghunathan, Saurabh Sirohi, V. Ruparelia, P. K. Sharma, Dimitris P. Ioannou, Vibhor Jain, H. K. Kakara, S. Gedela, V. Vanukuru, P. Dongmo, C. Luce, R. Hazbun, R. Krishnasamy, J. Hwang, M. Levy, K. Welch, S. Liu, B. Cucci, S. Cole, J. Kantarovsky, A. Vallett, I. McCallum-Cook, M. Yu, R. Phelps, A. Divergilio, A. Sturm, M. Peters, S. Johnson, R. Rassel, M. Lagerquist, M. Kerbaugh, K. Newton, J. Pekarik, Q. Liu
Performance Improvements of SiGe HBTs in 90nm BiCMOS Process with fT/fmax of 340/410 GHz. BCICTS (2022)
Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam
Robust Off-State TDDB Reliability of n-LDMOS. IRPS (2022)
Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam W. DiVergilio, Vibhor Jain, John J. Pekarik
Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs. BCICTS (2021)
Uppili S. Raghunathan, Pui Yee, Dave Brochu, Vibhor Jain, Harrison P. Lee, John D. Cressler, Dimitris P. Ioannou
Physics of Hot Carrier Degradation Under Saturation Mode Operation in SiGe HBTs. BCICTS (2020)
Dimitris P. Ioannou, Y. Tan, R. Logan, K. Bandy, R. Achanta, P. C. Wang, Dave Brochu, M. Jaffe
Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs. IRPS (2018)
Dimitris P. Ioannou
HKMG CMOS technology qualification: The PBTI reliability challenge. Microelectron. Reliab. 54 (8) (2014)