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Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs.

Dimitris P. IoannouY. TanR. LoganK. BandyR. AchantaP. C. WangDave BrochuM. Jaffe
Published in: IRPS (2018)
Keyphrases
  • artificial intelligence
  • multiresolution
  • relevance feedback
  • radio frequency
  • negative effects
  • atomic force microscopy