A. Muehlhoff

Publication Activity (10 Years)

Years Active: 2001-2020
Publications (10 Years): 1

Top Topics

Prior Knowledge

Similarity Measure

Software Reliability

Conceptual Model

Top Venues

Publications

Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula
A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. IRPS (2020)
A. Muehlhoff
Inversion of degradation direction of n-channel MOS-FETs in off-state operation. Microelectron. Reliab. 42 (9-11) (2002)
A. Muehlhoff
An Extrapolation Model for Lifetime Prediction for Off-State - Degradation of MOS-FETs. Microelectron. Reliab. 41 (9-10) (2001)