An Extrapolation Model for Lifetime Prediction for Off-State - Degradation of MOS-FETs.

Published in: Microelectron. Reliab. (2001)

Keyphrases

prediction model
high level
formal model
state space
theoretical framework
computational model
prediction accuracy
hybrid model
experimental data
statistical model
image segmentation
data sets
management system
probabilistic model
cost function
sensitivity analysis
artificial neural networks
machine learning