A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology.
Wafa ArfaouiGermain BossuA. MuehlhoffD. LippR. ManuwaldT. ChenTanya NigamMahesh SiddabathulaPublished in: IRPS (2020)
Keyphrases
- computational model
- statistical model
- formal model
- information technology
- prior knowledge
- management system
- mathematical model
- theoretical analysis
- software reliability
- prediction model
- conceptual model
- experimental data
- information systems
- software engineering
- probabilistic model
- similarity measure
- high level
- decision making