Germain Bossu

Publication Activity (10 Years)

Years Active: 2020-2023
Publications (10 Years): 5

Top Topics

Software Reliability

Top Venues

Publications

D. Lipp, Z. Zhao, G. Krause, Wafa Arfaoui, Elodie Ebrard, Germain Bossu, S. Evseev, Markus Herklotz, Mahesh Siddabathula
Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications. IRPS (2023)
Germain Bossu, Shafi Syed, S. Evseev, Joris Angelo Sundaram Jerome, Wafa Arfaoui, D. Lipp, Mahesh Siddabathula
22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability. IRPS (2022)
Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. IRPS (2021)
Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. IRPS (2021)
Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula
A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. IRPS (2020)