Jung-Suk Goo

Publication Activity (10 Years)

Years Active: 2002-2021
Publications (10 Years): 1

Top Topics

Modeling Framework

Reliability Analysis

Top Venues

Publications

Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. IRPS (2021)
Bo Yu, Xin Li, James Yonemura, Zhiyuan Wu, Jung-Suk Goo, Ciby Thuruthiyil, Ali Icel
Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables. CICC (2012)
Jung-Suk Goo, Richard Q. Williams, Glenn O. Workman, Qiang Chen, Sungjae Lee, Edward J. Nowak
Compact modeling and simulation of PD-SOI MOSFETs: Current status and challenges. CICC (2008)
Sushant Suryagandh, Mayank Gupta, Zhiyuan Wu, Srinath Krishnan, Mario Pelella, Jung-Suk Goo, Ciby Thuruthiyil, Judy X. An, Brian Q. Chen, Niraj Subba, Luis Zamudio, James Yonemura, Ali B. Icel
Impact of stress on various circuit characteristics in 65nm PDSOI technology. ESSCIRC (2007)
Jung-Suk Goo, Hee-Tae Ahn, Donald J. Ladwig, Zhiping Yu, Thomas H. Lee, Robert W. Dutton
A noise optimization technique for integrated low-noise amplifiers. IEEE J. Solid State Circuits 37 (8) (2002)