Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables.
Bo YuXin LiJames YonemuraZhiyuan WuJung-Suk GooCiby ThuruthiyilAli IcelPublished in: CICC (2012)
Keyphrases
- low frequency
- random variables
- high frequency
- graphical models
- frequency domain
- wavelet transform
- additive noise
- probability distribution
- joint distribution
- conditional independence
- wavelet coefficients
- frequency band
- latent variables
- conditional probabilities
- high frequency components
- subband
- stochastic optimization problems
- low pass
- distribution function
- discrete wavelet transform
- normal distribution
- lead time
- conditionally independent
- low and high frequency
- high resolution
- bayesian networks
- feature extraction
- spatial domain
- marginal distributions
- random vectors
- image segmentation
- image quality
- conditional distributions
- multiresolution
- identically distributed
- fusion rules
- electromagnetic fields