Y. Jeong

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 3

Top Topics

Metal Oxide Semiconductor

Error Probability

Top Venues

Publications

D. Tiernc, Antonio Arreghini, Alicja Lesniewska, Y. Jeong, Marleen H. van der Veen, J. Stiers, N. Bazzazian, Ivan Ciofi, Geert Van den Bosch, Maarten Rosmeulen
Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND. IRPS (2024)
Yusuke Higashi, J. P. Bastos, Adrian Vaisman Chasin, Laurent Breuil, Antonio Arreghini, S. Ramesh, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen
Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance. IRPS (2024)
S. Rachidi, S. Ramesh, Davide Tierno, G. L. Donadio, A. Pacco, J. W. Maes, Y. Jeong, Antonio Arreghini, Geert Van den Bosch, Maarten Rosmeulen
Pure-Metal Replacement Gate for Reliable 30 nm Pitch Scaled 3D NAND Flash. IMW (2024)
T. V. Nguyen, Y. Jeong, J. S. Kwak, H. Shin
Secure multiple-input single-output communication - Part I: secrecy rates and switched power allocation. IET Commun. 8 (8) (2014)
T. V. Nguyen, Y. Jeong, J. S. Kwak, H. Shin
Secure multiple-input single-output communication - Part II: δ-secrecy symbol error probability and secrecy diversity. IET Commun. 8 (8) (2014)