Aaron Thean

Publication Activity (10 Years)

Years Active: 2012-2020
Publications (10 Years): 4

Top Topics

Schottky Barrier

Shape Variability

Top Venues

Publications

Kamalika Datta, Arko Dutt, Ahmed Zaky, Umesh Chand, Devendra Singh, Yida Li, Jackson Chun-Yang Huang, Aaron Thean, Mohamed M. Sabry Aly
Fledge: Flexible Edge Platforms Enabled by In-memory Computing. DATE (2020)
D. Verreck, Anne S. Verhulst, Bart Soree, Nadine Collaert, Anda Mocuta, Aaron Thean, Guido Groeseneken
Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors. ESSDERC (2016)
Bon Woong Ku, Peter Debacker, Dragomir Milojevic, Praveen Raghavan, Diederik Verkest, Aaron Thean, Sung Kyu Lim
Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs. ISLPED (2016)
Tarun Agarwal, Iuliana P. Radu, Praveen Raghavan, Gianluca Fiori, Aaron Thean, Marc M. Heyns, Wim Dehaene
Effect of material parameters on two-dimensional materials based TFETs: An energy-delay perspective. ESSCIRC (2016)
Nathalie Fievet, Praveen Raghavan, Rogier Baert, Frédéric Robert, Abdelkarim Mercha, Diederik Verkest, Aaron Thean
Impact of device and interconnect process variability on clock distribution. ICICDT (2015)
Kazuyuki Tomida, Keizo Hiraga, Morin Dehan, Geert Hellings, Doyoung Jang, Kenichi Miyaguchi, Thomas Chiarella, Minsoo Kim, Anda Mocuta, Naoto Horiguchi, Abdelkarim Mercha, Diederik Verkest, Aaron Thean
Impact of fin shape variability on device performance towards 10nm node. ICICDT (2015)
Abhitosh Vais, Koen Martens, Jacopo Franco, Dennis Lin, AliReza Alian, Philippe Roussel, S. Sioncke, Nadine Collaert, Aaron Thean, Marc M. Heyns, Guido Groeseneken, Kristin De Meyer
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices. IRPS (2015)
Odysseas Zografos, Praveen Raghavan, Yasser Sherazi, Adrien Vaysset, Florin Ciubatoru, Bart Soree, Rudy Lauwereins, Iuliana P. Radu, Aaron Thean
Area and routing efficiency of SWD circuits compared to advanced CMOS. ICICDT (2015)
Geert Hellings, Mirko Scholz, Mikael Detalle, Dimitrios Velenis, Muriel de Potter de ten Broeck, C. Roda Neve, Y. Li, Stefaan Van Huylenbroeck, Shih-Hung Chen, Erik Jan Marinissen, Antonio La Manna, Geert Van der Plas, Dimitri Linten, Eric Beyne, Aaron Thean
Active-lite interposer for 2.5 & 3D integration. VLSIC (2015)
Bertrand Parvais, Piet Wambacq, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Ken Sawada, Kazuki Nomoto, Tetsuya Oishi, Hiroaki Ammo
A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS. A-SSCC (2015)
Marie Garcia Bardon, P. Schuddinck, Praveen Raghavan, Doyoung Jang, Dmitry Yakimets, Abdelkarim Mercha, Diederik Verkest, Aaron Thean
Dimensioning for power and performance under 10nm: The limits of FinFETs scaling. ICICDT (2015)
Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha, Pieter Weckx, Erik Bury, Z. Ji, A. De Keersgieter, Thomas Chiarella, Naoto Horiguchi, Guido Groeseneken, Aaron Thean
Origins and implications of increased channel hot carrier variability in nFinFETs. IRPS (2015)
Kenichi Miyaguchi, Bertrand Parvais, Lars-Åke Ragnarsson, Piet Wambacq, Praveen Raghavan, Abdelkarim Mercha, Anda Mocuta, Diederik Verkest, Aaron Thean
Modeling FinFET metal gate stack resistance for 14nm node and beyond. ICICDT (2015)
Geert Eneman, A. De Keersgieter, Anda Mocuta, Nadine Collaert, Aaron Thean
FinFET stressor efficiency on alternative wafer and channel orientations for the 14 nm node and below. ICICDT (2015)
Pieter Weckx, Ben Kaczer, Praveen Raghavan, Jacopo Franco, Marco Simicic, Philippe J. Roussel, Dimitri Linten, Aaron Thean, Diederik Verkest, Francky Catthoor, Guido Groeseneken
Characterization and simulation methodology for time-dependent variability in advanced technologies. CICC (2015)
Dmitry Yakimets, Doyoung Jang, Praveen Raghavan, Geert Eneman, Hans Mertens, P. Schuddinck, Arindam Mallik, Marie Garcia Bardon, Nadine Collaert, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Kristin De Meyer
Lateral NWFET optimization for beyond 7nm nodes. ICICDT (2015)
Jacopo Franco, Ben Kaczer, Philippe J. Roussel, Erik Bury, Hans Mertens, Romain Ritzenthaler, Tibor Grasser, Naoto Horiguchi, Aaron Thean, Guido Groeseneken
NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures. IRPS (2015)
M. Ali Pourghaderi, Anda Mocuta, Aaron Thean
Nonparabolicity and confinement effects of IIIV materials in novel transistors. ICICDT (2015)
Praveen Raghavan, Marie Garcia Bardon, Doyoung Jang, P. Schuddinck, Dmitry Yakimets, Julien Ryckaert, Abdelkarim Mercha, Naoto Horiguchi, Nadine Collaert, Anda Mocuta, Dan Mocuta, Zsolt Tokei, Diederik Verkest, Aaron Thean, A. Steegen
Holisitic device exploration for 7nm node. CICC (2015)
Julien Ryckaert, Praveen Raghavan, Rogier Baert, Marie Garcia Bardon, M. Dusa, Arindam Mallik, Sushil Sakhare, B. Vandewalle, Piet Wambacq, Bharani Chava, Kris Croes, Morin Dehan, Doyoung Jang, P. Leray, T.-T. Liu, Kenichi Miyaguchi, Bertrand Parvais, P. Schuddinck, P. Weemaes, Abdelkarim Mercha, Jürgen Bömmels, N. Horiguchi, G. McIntyre, Aaron Thean, Zsolt Tokei, S. Cheng, Diederik Verkest, A. Steegen
Design Technology co-optimization for N10. CICC (2014)
Odysseas Zografos, Praveen Raghavan, Luca Gaetano Amarù, Bart Soree, Rudy Lauwereins, Iuliana P. Radu, Diederik Verkest, Aaron Thean
System-level assessment and area evaluation of Spin Wave logic circuits. NANOARCH (2014)
Trong Huynh Bao, Dmitry Yakimets, Julien Ryckaert, Ivan Ciofi, Rogier Baert, Anabela Veloso, Jürgen Bömmels, Nadine Collaert, Philippe Roussel, S. Demuynck, Praveen Raghavan, Abdelkarim Mercha, Zsolt Tokei, Diederik Verkest, Aaron Thean, Piet Wambacq
Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies. ESSDERC (2014)
Chunmeng Dou, Dennis Lin, Abhitosh Vais, Tsvetan Ivanov, Han-Ping Chen, Koen Martens, Kuniyuki Kakushima, Hiroshi Iwai, Yuan Taur, Aaron Thean, Guido Groeseneken
As MOS capacitors from capacitance-voltage characteristics measured at various temperatures. Microelectron. Reliab. 54 (4) (2014)
Marc Aoulaiche, Eddy Simoen, Romain Ritzenthaler, Tom Schram, Hiroaki Arimura, Moonju Cho, Thomas Kauerauf, Guido Groeseneken, Naoto Horiguchi, Aaron Thean, Antonio Federico, Felice Crupi, Alessio Spessot, Christian Caillat, Pierre Fazan, H.-J. Na, Y. Son, K. B. Noh
Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors. ESSDERC (2013)
Tommaso Romeo, Luigi Pantisano, Eddy Simoen, Raymond Krom, Mitsuhiro Togo, N. Horiguchi, Jérôme Mitard, Aaron Thean, Guido Groeseneken, Cor Claeys, Felice Crupi
Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs. ESSDERC (2012)
Romain Ritzenthaler, Tom Schram, Erik Bury, Jérôme Mitard, L.-Å. Ragnarsson, Guido Groeseneken, N. Horiguchi, Aaron Thean, Alessio Spessot, Christian Caillat, V. Srividya, Pierre Fazan
Low-power DRAM-compatible Replacement Gate High-k/Metal Gate stacks. ESSDERC (2012)