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Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs.

Bon Woong KuPeter DebackerDragomir MilojevicPraveen RaghavanDiederik VerkestAaron TheanSung Kyu Lim
Published in: ISLPED (2016)
Keyphrases
  • data analysis
  • physical design
  • design methodology
  • knowledge discovery
  • data mining
  • query optimization
  • database
  • neural network
  • mobile computing
  • chip design