Login / Signup

Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs.

Tommaso RomeoLuigi PantisanoEddy SimoenRaymond KromMitsuhiro TogoN. HoriguchiJérôme MitardAaron TheanGuido GroesenekenCor ClaeysFelice Crupi
Published in: ESSDERC (2012)
Keyphrases