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As MOS capacitors from capacitance-voltage characteristics measured at various temperatures.

Chunmeng DouDennis LinAbhitosh VaisTsvetan IvanovHan-Ping ChenKoen MartensKuniyuki KakushimaHiroshi IwaiYuan TaurAaron TheanGuido Groeseneken
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • transmission line
  • electric field
  • power system
  • integrated circuit
  • image processing
  • power supply
  • high voltage
  • machine learning
  • decision trees
  • low voltage
  • short circuit
  • metal oxide