Origins and implications of increased channel hot carrier variability in nFinFETs.
Ben KaczerJacopo FrancoM. ChoTibor GrasserPhilippe J. RousselStanislav TyaginovM. BinaYannick WimmerLuis-Miguel ProcelLionel TrojmanFelice CrupiGregory PitnerVamsi PutchaPieter WeckxErik BuryZ. JiA. De KeersgieterThomas ChiarellaNaoto HoriguchiGuido GroesenekenAaron TheanPublished in: IRPS (2015)