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NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures.

Jacopo FrancoBen KaczerPhilippe J. RousselErik BuryHans MertensRomain RitzenthalerTibor GrasserNaoto HoriguchiAaron TheanGuido Groeseneken
Published in: IRPS (2015)
Keyphrases
  • dynamic model
  • reliability analysis
  • computer vision
  • real time
  • multi view
  • bit rate
  • massively parallel
  • single point
  • software reliability
  • neural architectures
  • reliability assessment
  • gallium arsenide