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ERMAVSS@DATE
2016
2016
2016
Keyphrases
Publications
2016
Ahmed Benhassain
,
Florian Cacho
,
Vincent Huard
,
Lorena Anghel
Early failure prediction by using in-situ monitors: Implementation and application results.
ERMAVSS@DATE
(2016)
Illani Mohd Nawi
,
Basel Halak
,
Mark Zwolinski
Ageing Impact on a High Speed Voltage Comparator with Hysteresis.
ERMAVSS@DATE
(2016)
Mohamed Selim
,
Eric Jeandeau
,
Cyril Desclèves
Design-Reliability Flow and Advanced Models Address IC-Reliability Issues.
ERMAVSS@DATE
(2016)
Ajith Sivadasan
,
Florian Cacho
,
Sidi Ahmed Benhassain
,
Vincent Huard
,
Lorena Anghel
Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.
ERMAVSS@DATE
(2016)
Alireza Namazi
,
Meisam Abdollahi
LPVM: Low-Power Variation-Mitigant Adder Architecture Using Carry Expedition.
ERMAVSS@DATE
(2016)
Shengyu Duan
,
Basel Halak
,
Rick Wong
,
Mark Zwolinski
NBTI Lifetime Evaluation and Extension in Instruction Caches.
ERMAVSS@DATE
(2016)
Haider Abbas
,
Mark Zwolinski
,
Basel Halak
Static Aging Analysis Using 3-Dimensional Delay Library.
ERMAVSS@DATE
(2016)
Fabian Oboril
,
Mehdi Baradaran Tahoori
Cross-Layer Approaches for an Aging-Aware Design Space Exploration for Microprocessors.
ERMAVSS@DATE
(2016)
Dimitrios Rodopoulos
,
Philippe Roussel
,
Francky Catthoor
,
Yiannakis Sazeides
,
Dimitrios Soudris
Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point.
ERMAVSS@DATE
(2016)
Abhijit K. Deb
,
Bart Vermeulen
,
Luc van Dijk
Overview of Health Monitoring Techniques for Reliability.
ERMAVSS@DATE
(2016)
Theodor Hillebrand
,
Nico Hellwege
,
Steffen Paul
,
Dagmar Peters-Drolshagen
Reliability-aware design method for CMOS circuits.
ERMAVSS@DATE
(2016)
volume 1566, 2016
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016.
ERMAVSS@DATE
1566 (2016)