ERMAVSS@DATE

Keyphrases

Publications

2016

Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel
Early failure prediction by using in-situ monitors: Implementation and application results. ERMAVSS@DATE (2016)
Illani Mohd Nawi, Basel Halak, Mark Zwolinski
Ageing Impact on a High Speed Voltage Comparator with Hysteresis. ERMAVSS@DATE (2016)
Mohamed Selim, Eric Jeandeau, Cyril Desclèves
Design-Reliability Flow and Advanced Models Address IC-Reliability Issues. ERMAVSS@DATE (2016)
Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel
Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. ERMAVSS@DATE (2016)
Alireza Namazi, Meisam Abdollahi
LPVM: Low-Power Variation-Mitigant Adder Architecture Using Carry Expedition. ERMAVSS@DATE (2016)
Shengyu Duan, Basel Halak, Rick Wong, Mark Zwolinski
NBTI Lifetime Evaluation and Extension in Instruction Caches. ERMAVSS@DATE (2016)
Haider Abbas, Mark Zwolinski, Basel Halak
Static Aging Analysis Using 3-Dimensional Delay Library. ERMAVSS@DATE (2016)
Fabian Oboril, Mehdi Baradaran Tahoori
Cross-Layer Approaches for an Aging-Aware Design Space Exploration for Microprocessors. ERMAVSS@DATE (2016)
Dimitrios Rodopoulos, Philippe Roussel, Francky Catthoor, Yiannakis Sazeides, Dimitrios Soudris
Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point. ERMAVSS@DATE (2016)
Abhijit K. Deb, Bart Vermeulen, Luc van Dijk
Overview of Health Monitoring Techniques for Reliability. ERMAVSS@DATE (2016)
Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen
Reliability-aware design method for CMOS circuits. ERMAVSS@DATE (2016)

volume 1566, 2016

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016. ERMAVSS@DATE 1566 (2016)