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Ahmed Benhassain
Publication Activity (10 Years)
Years Active: 2015-2017
Publications (10 Years): 7
Top Topics
Functional Decomposition
Failure Prediction
Environmental Conditions
Inter Subject
Top Venues
IOLTS
ERMAVSS@DATE
CICC
VTS
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Publications
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Souhir Mhira
,
Vincent Huard
,
Ahmed Benhassain
,
Florian Cacho
,
Sylvie Naudet
,
A. Jain
,
C. R. Parthasarathy
,
Alain Bravaix
Dynamic aging compensation and Safety measures in Automotive environment.
IOLTS
(2017)
Florian Cacho
,
Ahmed Benhassain
,
Riddhi Jitendrakumar Shah
,
Souhir Mhira
,
Vincent Huard
,
Lorena Anghel
Investigation of critical path selection for in-situ monitors insertion.
IOLTS
(2017)
Souhir Mhira
,
Vincent Huard
,
Ahmed Benhassain
,
Florian Cacho
,
David Meyer
,
Sylvie Naudet
,
A. Jain
,
C. R. Parthasarathy
,
Alain Bravaix
Cognitive approach to support dynamic aging compensation.
ITC
(2017)
Florian Cacho
,
Ahmed Benhassain
,
Souhir Mhira
,
Ajith Sivadasan
,
Vincent Huard
,
P. Cathelin
,
V. Knopik
,
A. Jain
,
C. R. Parthasarathy
,
Lorena Anghel
Activity profiling: Review of different solutions to develop reliable and performant design.
IOLTS
(2016)
Lorena Anghel
,
Ahmed Benhassain
,
Ajith Sivadasan
,
Florian Cacho
,
Vincent Huard
Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results.
VTS
(2016)
Ahmed Benhassain
,
Souhir Mhira
,
Florian Cacho
,
Vincent Huard
,
Lorena Anghel
In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability.
IVSW
(2016)
Ahmed Benhassain
,
Florian Cacho
,
Vincent Huard
,
Lorena Anghel
Early failure prediction by using in-situ monitors: Implementation and application results.
ERMAVSS@DATE
(2016)
Ahmed Benhassain
,
Florian Cacho
,
Vincent Huard
,
M. Saliva
,
Lorena Anghel
,
C. R. Parthasarathy
,
A. Jain
,
Fabien Giner
Timing in-situ monitors: Implementation strategy and applications results.
CICC
(2015)
M. Saliva
,
Florian Cacho
,
Vincent Huard
,
X. Federspiel
,
D. Angot
,
Ahmed Benhassain
,
Alain Bravaix
,
Lorena Anghel
Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.
DATE
(2015)