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Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.
M. Saliva
Florian Cacho
Vincent Huard
X. Federspiel
D. Angot
Ahmed Benhassain
Alain Bravaix
Lorena Anghel
Published in:
DATE (2015)
Keyphrases
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digital circuits
silicon on insulator
data flow
model based diagnosis
evolvable hardware
finite state machines
circuit design
decision diagrams
functional decomposition
failure rate