Halil Kukner

Publication Activity (10 Years)

Years Active: 2009-2024
Publications (10 Years): 2

Top Topics

Automated Visual Inspection

Rapid Development

Air Conditioning

Top Venues

Publications

Subrat Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, A. Sharma, G. Mirabeli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert
Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation. IRPS (2024)
Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. 25 (4) (2017)
Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser
The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC (2015)
Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. VTS (2015)
Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor
Bias Temperature Instability analysis of FinFET based SRAM cells. DATE (2014)
Halil Kukner, Moustafa A. Khatib, Sebastien Morrison, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken
Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology. ISQED (2014)
Halil Kukner, Pieter Weckx, Sebastien Morrison, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken
NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes. DSD (2014)
Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor
Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. IDT (2013)
Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor
Bias temperature instability analysis in SRAM decoder. ETS (2013)
Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken
Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. DSD (2012)
Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor
BTI impact on logical gates in nano-scale CMOS technology. DDECS (2012)
Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor
Incorporating parameter variations in BTI impact on nano-scale logical gates analysis. DFT (2012)
Ad J. van de Goor, Said Hamdioui, Halil Kukner
Generic, orthogonal and low-cost March Element based memory BIST. ITC (2011)
Ozgur Tasdizen, Abdulkadir Akin, Halil Kukner, Ilker Hamzaoglu
Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation. IEEE Trans. Consumer Electron. 55 (3) (2009)
Ozgur Tasdizen, Halil Kukner, Abdulkadir Akin, Ilker Hamzaoglu
A high performance reconfigurable Motion Estimation hardware architecture. DATE (2009)