The defect-centric perspective of device and circuit reliability - From individual defects to circuits.
Ben KaczerJacopo FrancoPieter WeckxPhilippe RousselErik BuryMoonju ChoRobin DegraeveDimitri LintenGuido GroesenekenHalil KuknerPraveen RaghavanFrancky CatthoorGerhard RzepaWolfgang GösTibor GrasserPublished in: ESSDERC (2015)
Keyphrases
- defect detection
- analog circuits
- high speed
- circuit design
- automated visual inspection
- tunnel diode
- delay insensitive
- electronic circuits
- digital circuits
- analog vlsi
- logic synthesis
- logic circuits
- vlsi circuits
- power reduction
- quality control
- semiconductor devices
- power dissipation
- printed circuit boards
- cmos technology
- multi aspect
- failure rate
- viewpoint
- image processing