Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model.
Halil KuknerPieter WeckxPraveen RaghavanBen KaczerFrancky CatthoorLiesbet Van der PerreRudy LauwereinsGuido GroesenekenPublished in: DSD (2012)