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Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity.

Seyab KhanMottaqiallah TaouilSaid HamdiouiHalil KuknerPraveen RaghavanFrancky Catthoor
Published in: IDT (2013)
Keyphrases
  • power consumption
  • real time
  • high speed
  • data transmission
  • defect detection