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Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity.
Seyab Khan
Mottaqiallah Taouil
Said Hamdioui
Halil Kukner
Praveen Raghavan
Francky Catthoor
Published in:
IDT (2013)
Keyphrases
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power consumption
real time
high speed
data transmission
defect detection