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Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology.

Halil KuknerMoustafa A. KhatibSebastien MorrisonPieter WeckxPraveen RaghavanBen KaczerFrancky CatthoorLiesbet Van der PerreRudy LauwereinsGuido Groeseneken
Published in: ISQED (2014)
Keyphrases
  • real time
  • data processing
  • rapid development
  • image analysis
  • cost effective
  • neural network
  • learning algorithm
  • social networks
  • information systems
  • image sequences
  • multiresolution
  • modal logic