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Alexander Grill
Publication Activity (10 Years)
Years Active: 2019-2024
Publications (10 Years): 14
Top Topics
Flip Flops
Quantum Computing
Schottky Barrier
Low Cost
Top Venues
IRPS
ETS
VLSI Technology and Circuits
ITC
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Publications
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Kateryna Serbulova
,
Zi-En Qiu
,
Shih-Hung Chen
,
Alexander Grill
,
Kuo-Hsing Kao
,
Jo De Boeck
,
Guido Groeseneken
Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications.
IRPS
(2024)
Francesco Lorenzelli
,
Asser Elsayed
,
Clement Godfrin
,
Alexander Grill
,
Stefan Kubicek
,
Ruoyu Li
,
Michele Stucchi
,
Danny Wan
,
Kristiaan De Greve
,
Erik Jan Marinissen
,
Georges G. E. Gielen
Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures.
ITC
(2023)
Francesco Lorenzelli
,
Asser Elsayed
,
Clement Godfrin
,
Alexander Grill
,
Stefan Kubicek
,
Ruoyu Li
,
Michele Stucchi
,
Danny Wan
,
Kristiaan De Greve
,
Erik Jan Marinissen
,
Georges G. E. Gielen
Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications.
ETS
(2023)
Alexander Grill
,
V. John
,
Jakob Michl
,
A. Beckers
,
Erik Bury
,
Stanislav Tyaginov
,
Bertrand Parvais
,
Adrian Chasin
,
Tibor Grasser
,
Michael Waltl
,
Ben Kaczer
,
Bogdan Govoreanu
Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.
IRPS
(2022)
Barry J. O'Sullivan
,
Brecht Truijen
,
Vamsi Putcha
,
Alexander Grill
,
Adrian Chasin
,
Geert Van den Bosch
,
Ben Kaczer
,
M. N. K. Alam
,
Jan Van Houdt
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics.
IRPS
(2022)
Stanislav Tyaginov
,
Aryan Afzalian
,
Alexander Makarov
,
Alexander Grill
,
Michiel Vandemaele
,
Maksim Cherenev
,
Mikhail I. Vexler
,
Geert Hellings
,
Ben Kaczer
On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors.
IRPS
(2022)
Kookjin Lee
,
Ben Kaczer
,
Anastasiia Kruv
,
Mario Gonzalez
,
Geert Eneman
,
Oguzhan O. Okudur
,
Alexander Grill
,
Jacopo Franco
,
Andrea Vici
,
Robin Degraeve
,
Ingrid De Wolf
Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress.
IRPS
(2022)
Stanislav Tyaginov
,
Alexander Makarov
,
Al-Moatasem Bellah El-Sayed
,
Adrian Chasin
,
Erik Bury
,
Markus Jech
,
Michiel Vandemaele
,
Alexander Grill
,
An De Keersgieter
,
Mikhail I. Vexler
,
Geert Eneman
,
Ben Kaczer
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.
IRPS
(2022)
Rohith Acharya
,
Anton Potocnik
,
Steven Brebels
,
Alexander Grill
,
Jeroen Verjauw
,
Tsvetan Ivanov
,
Daniel Perez Lozano
,
Danny Wan
,
Fahd A. Mohiyaddin
,
Jacques Van Damme
,
A. M. Vadiraj
,
Massimo Mongillo
,
Georges G. E. Gielen
,
Francky Catthoor
,
Jan Craninckx
,
Iuliana P. Radu
,
Bogdan Govoreanu
Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements.
VLSI Technology and Circuits
(2022)
Stanislav Tyaginov
,
Alexander Grill
,
Michiel Vandemaele
,
Tibor Grasser
,
Geert Hellings
,
Alexander Makarov
,
Markus Jech
,
Dimitri Linten
,
Ben Kaczer
A Compact Physics Analytical Model for Hot-Carrier Degradation.
IRPS
(2020)
Jakob Michl
,
Alexander Grill
,
Dieter Claes
,
Gerhard Rzepa
,
Ben Kaczer
,
Dimitri Linten
,
Iuliana P. Radu
,
Tibor Grasser
,
Michael Waltl
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures.
IRPS
(2020)
Anastasiia Kruv
,
Ben Kaczer
,
Alexander Grill
,
Mario Gonzalez
,
Jacopo Franco
,
Dimitri Linten
,
Wolfgang Gös
,
Tibor Grasser
,
Ingrid De Wolf
On the impact of mechanical stress on gate oxide trapping.
IRPS
(2020)
Alexander Grill
,
Erik Bury
,
Jakob Michl
,
Stanislav Tyaginov
,
Dimitri Linten
,
Tibor Grasser
,
Bertrand Parvais
,
Ben Kaczer
,
Michael Waltl
,
Iuliana P. Radu
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures.
IRPS
(2020)
Alexander Makarov
,
Ben Kaczer
,
Philippe Roussel
,
Adrian Chasin
,
Alexander Grill
,
Michiel Vandemaele
,
Geert Hellings
,
Al-Moatasem El-Sayed
,
Tibor Grasser
,
Dimitri Linten
,
Stanislav Tyaginov
Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.
IRPS
(2019)