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Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures.
Alexander Grill
Erik Bury
Jakob Michl
Stanislav Tyaginov
Dimitri Linten
Tibor Grasser
Bertrand Parvais
Ben Kaczer
Michael Waltl
Iuliana P. Radu
Published in:
IRPS (2020)
Keyphrases
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high speed
mobile devices
low cost
power consumption
low power
case study
user interface
processing capabilities
reliability analysis
context aware
smart phones
electronic devices
analog vlsi
reliability assessment