Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures.
Francesco LorenzelliAsser ElsayedClement GodfrinAlexander GrillStefan KubicekRuoyu LiMichele StucchiDanny WanKristiaan De GreveErik Jan MarinissenGeorges G. E. GielenPublished in: ITC (2023)