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Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress.

Kookjin LeeBen KaczerAnastasiia KruvMario GonzalezGeert EnemanOguzhan O. OkudurAlexander GrillJacopo FrancoAndrea ViciRobin DegraeveIngrid De Wolf
Published in: IRPS (2022)
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