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On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors.
Stanislav Tyaginov
Aryan Afzalian
Alexander Makarov
Alexander Grill
Michiel Vandemaele
Maksim Cherenev
Mikhail I. Vexler
Geert Hellings
Ben Kaczer
Published in:
IRPS (2022)
Keyphrases
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field effect transistors
schottky barrier
steady state
semiconductor devices
data mining
digital images
mathematical analysis
dynamically changing
high robustness
real world
machine learning
multi agent
sensor networks
dynamic environments
computational efficiency
changing environment