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On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors.

Stanislav TyaginovAryan AfzalianAlexander MakarovAlexander GrillMichiel VandemaeleMaksim CherenevMikhail I. VexlerGeert HellingsBen Kaczer
Published in: IRPS (2022)
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