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Brecht Truijen
Publication Activity (10 Years)
Years Active: 2021-2022
Publications (10 Years): 7
Top Topics
High Voltage
Mahalanobis Distance
Mechanisms Underlying
Adaptive Threshold
Top Venues
IRPS
VLSI Technology and Circuits
OFC
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Publications
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Md Nur K. Alam
,
Yusuke Higashi
,
Brecht Truijen
,
Ben Kaczer
,
Mihaela Ioana Popovici
,
Bj O'Sullivan
,
Philippe Roussel
,
Robin Degraeve
,
Marc M. Heyns
,
Jan Van Houdt
Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements.
VLSI Technology and Circuits
(2022)
Barry J. O'Sullivan
,
Brecht Truijen
,
Vamsi Putcha
,
Alexander Grill
,
Adrian Chasin
,
Geert Van den Bosch
,
Ben Kaczer
,
M. N. K. Alam
,
Jan Van Houdt
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics.
IRPS
(2022)
Kristof Croes
,
Veerle Simons
,
Brecht Truijen
,
Philippe Roussel
,
Koen Van Sever
,
Artemisia Tsiara
,
Jacopo Franco
,
Philippe Absil
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors.
OFC
(2022)
Brecht Truijen
,
Barry J. O'Sullivan
,
Md. Nurul Alam
,
Dieter Claes
,
M. Thesberg
,
Philippe Roussel
,
Adrian Chasin
,
Geert Van den Bosch
,
Ben Kaczer
,
Jan Van Houdt
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks.
IRPS
(2022)
J. P. Bastos
,
Barry J. O'Sullivan
,
Jacopo Franco
,
Stanislav Tyaginov
,
Brecht Truijen
,
Adrian Chasin
,
Robin Degraeve
,
Ben Kaczer
,
Romain Ritzenthaler
,
E. Capogreco
,
E. Dentoni Litta
,
Alessio Spessot
,
Yusuke Higashi
,
Y. Yoon
,
V. Machkaoutsan
,
Pierre Fazan
,
N. Horiguchi
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery.
IRPS
(2022)
Zhicheng Wu
,
Jacopo Franco
,
Brecht Truijen
,
Philippe Roussel
,
Stanislav Tyaginov
,
Michiel Vandemaele
,
Erik Bury
,
Guido Groeseneken
,
Dimitri Linten
,
Ben Kaczer
Physics-based device aging modelling framework for accurate circuit reliability assessment.
IRPS
(2021)
Yang Xiang
,
Stanislav Tyaginov
,
Michiel Vandemaele
,
Zhicheng Wu
,
Jacopo Franco
,
Erik Bury
,
Brecht Truijen
,
Bertrand Parvais
,
Dimitri Linten
,
Ben Kaczer
A BSIM-Based Predictive Hot-Carrier Aging Compact Model.
IRPS
(2021)