Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks.
Brecht TruijenBarry J. O'SullivanMd. Nurul AlamDieter ClaesM. ThesbergPhilippe RousselAdrian ChasinGeert Van den BoschBen KaczerJan Van HoudtPublished in: IRPS (2022)