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Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors.
Kristof Croes
Veerle Simons
Brecht Truijen
Philippe Roussel
Koen Van Sever
Artemisia Tsiara
Jacopo Franco
Philippe Absil
Published in:
OFC (2022)
Keyphrases
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assessment process
real time
image processing
artificial intelligence
case study
energy consumption
quality assessment
mechanism design
mechanisms underlying