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Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.

Alexander MakarovBen KaczerPhilippe RousselAdrian ChasinAlexander GrillMichiel VandemaeleGeert HellingsAl-Moatasem El-SayedTibor GrasserDimitri LintenStanislav Tyaginov
Published in: IRPS (2019)
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