Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.
Alexander MakarovBen KaczerPhilippe RousselAdrian ChasinAlexander GrillMichiel VandemaeleGeert HellingsAl-Moatasem El-SayedTibor GrasserDimitri LintenStanislav TyaginovPublished in: IRPS (2019)