Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.
Stanislav TyaginovAlexander MakarovAl-Moatasem Bellah El-SayedAdrian ChasinErik BuryMarkus JechMichiel VandemaeleAlexander GrillAn De KeersgieterMikhail I. VexlerGeert EnemanBen KaczerPublished in: IRPS (2022)